Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/4229
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Applied Physics | - |
dc.creator | Tsang, WS | - |
dc.creator | Chan, KY | - |
dc.creator | Mak, CL | - |
dc.creator | Wong, KH | - |
dc.date.accessioned | 2014-12-11T08:23:19Z | - |
dc.date.available | 2014-12-11T08:23:19Z | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10397/4229 | - |
dc.language.iso | en | en_US |
dc.publisher | American Institute of Physics | en_US |
dc.rights | © 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in W. S. Tsang, K. Y. Chan & C. L. Mak, Appl. Phys. Lett. 83, 1599 (2003) and may be found at http://apl.aip.org/resource/1/applab/v83/i8/p1599_s1 | en_US |
dc.subject | Lead compounds | en_US |
dc.subject | Magnesium compounds | en_US |
dc.subject | Titanium compounds | en_US |
dc.subject | Silicon | en_US |
dc.subject | Ferroelectric thin films | en_US |
dc.subject | Ellipsometry | en_US |
dc.subject | Epitaxial layers | en_US |
dc.subject | Pulsed laser deposition | en_US |
dc.subject | Vapour phase epitaxial growth | en_US |
dc.subject | Surface morphology | en_US |
dc.subject | Interface structure | en_US |
dc.subject | X-ray diffraction | en_US |
dc.subject | Scanning electron microscopy | en_US |
dc.subject | Refractive index | en_US |
dc.title | Spectroscopic ellipsometry study of epitaxially grown Pb(Mg₁/₃Nb₂/₃)O₃–PbTiO₃/MgO/TiN/Si heterostructures | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.description.otherinformation | Author name used in this publication: C. L. Mak | en_US |
dc.description.otherinformation | Author name used in this publication: K. H. Wong | en_US |
dc.identifier.spage | 1599 | - |
dc.identifier.epage | 1601 | - |
dc.identifier.volume | 83 | - |
dc.identifier.issue | 8 | - |
dc.identifier.doi | 10.1063/1.1603339 | - |
dcterms.abstract | 0.65Pb(Mg₁/₃Nb₂/₃)O₃–0.35PbTiO₃(PMN–PT) thin films have been grown on MgO/TiN-buffered Si(001) substrates using pulsed laser deposition. Their structural properties and surface morphology were examined by x-ray diffraction and scanning electron microscopy, respectively. All PMN–PT films grown at 670 °C show a cube-on-cube epitaxial relationship of PMN–PT(100)∥MgO(100)∥TiN(100)∥Si(100). Discernable interfaces between layers in the heterostructures and crack-free surfaces are evident. A spectroscopic ellipsometer was used to study the optical characteristics of the films. It was revealed that the refractive index of the PMN–PT is ∼2.50 as measured at 635 nm. This value is only slightly less than that of the PMN–PT single crystal of 2.60. Our results suggest that the PMN–PT/MgO/TiN/Si heterostructure has an excellent potential for use in integrated optical waveguide devices. | - |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | Applied physics letters, 25 Aug. 2003, v. 83, no. 8, p. 1599-1601 | - |
dcterms.isPartOf | Applied physics letters | - |
dcterms.issued | 2003-08-25 | - |
dc.identifier.isi | WOS:000184844100035 | - |
dc.identifier.scopus | 2-s2.0-0042782775 | - |
dc.identifier.eissn | 1077-3118 | - |
dc.identifier.rosgroupid | r19597 | - |
dc.description.ros | 2003-2004 > Academic research: refereed > Publication in refereed journal | - |
dc.description.oa | Version of Record | en_US |
dc.identifier.FolderNumber | OA_IR/PIRA | en_US |
dc.description.pubStatus | Published | en_US |
Appears in Collections: | Journal/Magazine Article |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Tsang_Epitaxially_Grown_Heterostructures.pdf | 59.62 kB | Adobe PDF | View/Open |
Page views
140
Last Week
3
3
Last month
Citations as of Apr 21, 2024
Downloads
239
Citations as of Apr 21, 2024
SCOPUSTM
Citations
27
Last Week
0
0
Last month
0
0
Citations as of Apr 26, 2024
WEB OF SCIENCETM
Citations
25
Last Week
0
0
Last month
0
0
Citations as of Apr 25, 2024
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.