Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4195
Title: The microprocesses of the quasicrystalline transformation in Zr₆₅ Ni₁₀ Cu₇.₅Al₇.₅Ag ₁₀ bulk metallic glass
Authors: Liu, L
Chan, KC 
Pang, GKH
Keywords: Zirconium alloys
Nickel alloys
Copper alloys
Aluminium alloys
Silver alloys
Metallic glasses
Glass structure
Glass transition
Quasicrystals
Stacking faults
Transmission electron microscopy
X-ray chemical analysis
Issue Date: 4-Oct-2004
Publisher: American Institute of Physics
Source: Applied physics letters, 4 Oct, 2004, v. 85, no. 14, p. 2788-2790 How to cite?
Journal: Applied physics letters 
Abstract: The microprocesses of the amorphous-to-quasicrystalline transformation in Zr₆₅ Ni₁₀ Cu₇.₅Al₇.₅Ag ₁₀ bulk metallic glass were studied in detail by transmission electron microscopy (TEM) and high-resolution TEM (HRTEM). It was found that the amorphous-to-quasicrystalline transformation in the present system undergoes a series of interprocesses and follows the sequence of the phase transformation of amorphous →FCC Zr₂Ni→Tetragonal Zr₂Ni→Tetragonal Zr₂Ni with a domain structure →Quasicrystals. HRTEM indicated that a domain structure with a high density of stacking faults was formed in the sample at the stage just prior to the formation of quasicrystals. This special structure seems to possess the structural symmetries similar to those of icosahedral quasicrystals. Nanobeam energy dispersive x-ray spectrum revealed that atomic diffusion was involved in all interprocesses of the phase transformations. This suggests that the amorphous-to-quasicrystalline transformation in the present bulk metallic glass is a nonpolymorphous reaction.
URI: http://hdl.handle.net/10397/4195
ISSN: 0003-6951 (print)
1077-3118 (online)
DOI: 10.1063/1.1801677
Rights: © 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in L. Liu, K. C. Chan & G. K. H. Pang, Appl. Phys. Lett. 85, 2788 (2004) and may be found at http://apl.aip.org/resource/1/applab/v85/i14/p2788_s1
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