Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/4192
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Applied Physics | - |
dc.contributor | Materials Research Centre | - |
dc.creator | Yeung, KM | - |
dc.creator | Tsang, WS | - |
dc.creator | Mak, CL | - |
dc.creator | Wong, KH | - |
dc.date.accessioned | 2014-12-11T08:24:27Z | - |
dc.date.available | 2014-12-11T08:24:27Z | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/10397/4192 | - |
dc.language.iso | en | en_US |
dc.publisher | American Institute of Physics | en_US |
dc.rights | © 2002 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in K. M. Yeung et al., J. Appl. Phys. 92, 3636 (2002) and may be found at http://link.aip.org/link/?jap/92/3636. | en_US |
dc.subject | Zinc compounds | en_US |
dc.subject | II-VI semiconductors | en_US |
dc.subject | Semiconductor thin films | en_US |
dc.subject | Manganese | en_US |
dc.subject | Pulsed laser depositiontion | en_US |
dc.subject | X-ray diffraction | en_US |
dc.subject | Photoluminescence | en_US |
dc.subject | Visible spectra | en_US |
dc.subject | Refractive index | en_US |
dc.subject | Absorption coefficients | en_US |
dc.subject | Energy gap | en_US |
dc.title | Optical studies of ZnS:Mn films grown by pulsed laser deposition | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.description.otherinformation | Author name used in this publication: C. L. Mak | en_US |
dc.description.otherinformation | Author name used in this publication: K. H. Wong | en_US |
dc.identifier.spage | 3636 | - |
dc.identifier.epage | 3640 | - |
dc.identifier.volume | 92 | - |
dc.identifier.issue | 7 | - |
dc.identifier.doi | 10.1063/1.1503389 | - |
dcterms.abstract | High-quality ZnS:Mn thin films have been deposited on (001)Si substrates at various temperatures using pulsed laser deposition. Their structural properties were characterized by x-ray diffraction. Optical studies by spectroscopic ellipsometry, optical transmittance, and photoluminescence measurements were systematically carried out on all film samples. In the analysis of the measured SE spectra, a modified double-layer Sellmeier model was adopted to represent the optical properties of the ZnS:Mn films. In this model, the films were assumed to consist of two layers—a bottom bulk ZnS:Mn layer and a surface layer composed of bulk ZnS:Mn as well as void. Good agreement was obtained between the measured spectra and the model calculations. Changes in the refractive indices of the ZnS:Mn films as a function of growth temperature were investigated. The PL and absorption measurements revealed that the orange-yellow emission band at ~590 nm and the absorption edge at ~370 nm upshifted to shorter wavelengths for films deposited at higher substrate temperatures. These results imply that the energy gap of the ZnS:Mn films increases with growth temperature. The observed changes of optical properties in these films are correlated to their structural qualities. | - |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | Journal of applied physics, 1 Oct. 2002, v. 92, no. 7, p. 3636-3640 | - |
dcterms.isPartOf | Journal of applied physics | - |
dcterms.issued | 2002-10-01 | - |
dc.identifier.isi | WOS:000178087600033 | - |
dc.identifier.scopus | 2-s2.0-18644367506 | - |
dc.identifier.eissn | 1089-7550 | - |
dc.identifier.rosgroupid | r13755 | - |
dc.description.ros | 2002-2003 > Academic research: refereed > Publication in refereed journal | - |
dc.description.oa | Version of Record | en_US |
dc.identifier.FolderNumber | OA_IR/PIRA | en_US |
dc.description.pubStatus | Published | en_US |
Appears in Collections: | Journal/Magazine Article |
Files in This Item:
File | Description | Size | Format | |
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Yeung_Optical_studies_ZnS.pdf | 98.17 kB | Adobe PDF | View/Open |
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