Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4172
Title: Investigation of electromechanical properties in ferroelectric thin films using Monte Carlo simulation
Authors: Cao, HX
Lo, VC
Chung, WWY
Keywords: Electromechanical effects
Ferroelectric thin films
Monte Carlo methods
Potts model
Deformation
Internal stresses
Dielectric polarisation
Dielectric hysteresis
Phase transformations
Issue Date: 15-Jan-2006
Publisher: American Institute of Physics
Source: Journal of applied physics, 15 Jan. 2006, v. 99, no. 2, 024103, p. 1-7 How to cite?
Journal: Journal of applied physics 
Abstract: Electromechanical properties of ferroelectric thin films are investigated using a two-dimensional four-state Potts model and Monte Carlo simulation. In this model, the mechanical energy density induced by strains of individual cells is included in the system Hamiltonian, in addition to the contributions from dipole-dipole and electric-field-dipole couplings. Moreover, the dipole of each individual perovskite cell is aligned to one of the four mutually perpendicular directions. Four different states of dipole orientations can be defined. The deformation of each cell is associated with its dipole orientation, resulting in two different strain states. Polarization–electric-field hysteresis loops, butterfly loops for both transverse and longitudinal strains against electric field, as well as the phase-transition temperature under different stresses and anisotropy conditions are simulated. Results are comparable to the experimental measurements.
URI: http://hdl.handle.net/10397/4172
ISSN: 0021-8979 (print)
1089-7550 (online)
DOI: 10.1063/1.2162269
Rights: © 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in H. X. Cao, V. C. Lo & W. W. Y. Chung, J. Appl. Phys. 99, 024103 (2006) and may be found at http://link.aip.org/link/?jap/99/024103.
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