Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4027
Title: Curie temperature and critical thickness of ferroelectric thin films
Authors: Wang, B
Woo, CH
Keywords: Barium compounds
Lead compounds
Ferroelectric thin films
Ferroelectric Curie temperature
Ginzburg-Landau theory
Dielectric depolarisation
Dielectric polarisation
Free energy
Supercooling
Ferroelectric transitions
Internal stresses
Stress relaxation
Issue Date: 15-Apr-2005
Publisher: American Institute of Physics
Source: Journal of applied physics, 15 Apr. 2005, v. 97, no. 8, 084109, p. 1-10 How to cite?
Journal: Journal of applied physics 
Abstract: The dynamic Ginzburg–Landau theory is applied to establish the critical conditions that control the transition between the paraelectric and ferroelectric states. Analytic expressions of the para-ferroelectric transition temperatures in a thin film under various electromechanical surface conditions are derived via a linear stability analysis of the evolutionary trajectory of the system for both first- and second-order transitions. Explicit expressions are then derived for the critical thickness, below which the thin film is paraelectric for all temperatures. For first-order transitions, the difference between the superheating and supercooling transition temperatures is found to be insensitive to the film thickness and surface boundary conditions. From these expressions, the relative importance on ferroelectricity in thin films due to applied mechanical constraints on the transformation strain and the depolarizing effect of surface charges is discussed and compared with experimental data.
URI: http://hdl.handle.net/10397/4027
ISSN: 0021-8979 (print)
1089-7550 (online)
DOI: 10.1063/1.1861517
Rights: © 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in B. Wang & C. H. Woo, J. Appl. Phys. 97, 084109 (2005) and may be found at http://link.aip.org/link/?jap/97/084109.
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