Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/27160
Title: Method to measure the viscosity of nanometer liquid films from the surface fluctuations
Authors: Yang, Z
Lam, CH 
DiMasi, E
Bouet, N
Jordan-Sweet, J
Tsui, OKC
Issue Date: 2009
Publisher: American Institute of Physics
Source: Applied physics letters, 2009, v. 94, no. 25, 251906 How to cite?
Journal: Applied physics letters 
Abstract: We describe a method to measure the viscosity of polystyrene liquid films with thicknesses ∼5 and ∼80 nm spin-cast on oxide-coated silicon. In this method, temporal evolution of the film surface is monitored and modeled according to the dynamics of the surface capillary waves. Viscosities obtained from the ∼80 nm films display an excellent agreement with those of the bulk polymer, but those from the ∼5 nm films are up to 106 times reduced. By modeling the data to the Vogel-Fulcher-Tammann relation, we find that the observations are consistent with the thickness dependence of the glass transition temperature previously reported of these films.
URI: http://hdl.handle.net/10397/27160
ISSN: 0003-6951
EISSN: 1077-3118
DOI: 10.1063/1.3158956
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