Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/27160
Title: Method to measure the viscosity of nanometer liquid films from the surface fluctuations
Authors: Yang, Z
Lam, CH 
DiMasi, E
Bouet, N
Jordan-Sweet, J
Tsui, OKC
Issue Date: 2009
Source: Applied physics letters, 2009, v. 94, no. 25, 251906, p. 251906-1-251906-3
Abstract: We describe a method to measure the viscosity of polystyrene liquid films with thicknesses ∼5 and ∼80 nm spin-cast on oxide-coated silicon. In this method, temporal evolution of the film surface is monitored and modeled according to the dynamics of the surface capillary waves. Viscosities obtained from the ∼80 nm films display an excellent agreement with those of the bulk polymer, but those from the ∼5 nm films are up to 106 times reduced. By modeling the data to the Vogel-Fulcher-Tammann relation, we find that the observations are consistent with the thickness dependence of the glass transition temperature previously reported of these films.
Publisher: American Institute of Physics
Journal: Applied physics letters 
ISSN: 0003-6951
EISSN: 1077-3118
DOI: 10.1063/1.3158956
Rights: © 2009 American Institute of Physics.
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Z. Yang et al., Appl. Phys. Lett. 94, 251906 (2009) and may be found at https://dx.doi.org/10.1063/1.3158956
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