Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/192
Title: The bi-elliptical deformable contour and its application to automated tongue segmentation in Chinese medicine
Authors: Pang, B
Zhang, DD 
Wang, K
Keywords: Chinese medicine
Deformable templates
Medical biometrics
Snakes
Tongue image segmentation
Issue Date: Aug-2005
Publisher: IEEE
Source: IEEE transactions on medical imaging, Aug. 2005, v. 24, no. 8, p. 946-956 How to cite?
Journal: IEEE transactions on medical imaging 
Abstract: Automated tongue image segmentation, in Chinese medicine, is difficult due to two special factors: 1) there are many pathological details on the surface of the tongue, which have a large influence on edge extraction; 2) the shapes of the tongue bodies captured from various persons (with different diseases) are quite different, so they are impossible to describe properly using a predefined deformable template. To address these problems, in this paper, we propose an original technique that is based on a combination of a bi-elliptical deformable template (BEDT) and an active contour model, namely the bi-elliptical deformable contour (BEDC). The BEDT captures gross shape features by using the steepest decent method on its energy function in the parameter space. The BEDC is derived from the BEDT by substituting template forces for classical internal forces, and can deform to fit local details. Our algorithm features fully automatic interpretation of tongue images and a consistent combination of global and local controls via the template force. We apply the BEDC to a large set of clinical tongue images and present experimental results.
URI: http://hdl.handle.net/10397/192
ISSN: 0278-0062
DOI: 10.1109/TMI.2005.850552
Rights: © 2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
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