Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/1886
Title: Optimized acquisition time and image sampling for dynamic SPECT of Tl-201
Authors: Lau, CH
Eberl, S
Feng, DD
Iida, H
Lun, PKD 
Siu, WC 
Tamura, Y
Bautovich, GJ
Ono, Y
Keywords: Compartmental modeling
Optimum image sampling schedule
SPECT
Tl-201 tracer kinetics
Issue Date: Jun-1998
Publisher: IEEE
Source: IEEE transactions on medical imaging, June 1998, v. 17, no. 3, p. 334-343 How to cite?
Journal: IEEE transactions on medical imaging 
Abstract: With the recent development in scatter and attenuation correction algorithms, dynamic single photon emission computerized tomography (SPECT) can potentially yield physiological parameters, with tracers exhibiting suitable kinetics such as thallium-201 (Tl-201). A systematic way is proposed to investigate the minimum data acquisition times and sampling requirements for estimating physiological parameters with quantitative dynamic SPECT.
Two different sampling schemes were investigated with Monte Carlo simulations: 1) Continuous data collection for total study duration ranging from 30–240 min. 2) Continuous data collection for first 10–45 min followed by a delayed study at approximately 3 h. Tissue time activity curves with realistic noise were generated from a mean plasma time activity curve and rate constants (K₁- k₄) derived from Tl-201 kinetic studies in 16 dogs. Full dynamic sampling schedules (DynSS) were compared to optimum sampling schedules (OSS).
We found that OSS can reliably estimate the blood flow related K₁ and V[sub d] comparable to DynSS. A 30-min continuous collection was sufficient if only K₁ was of interest. A split session schedule of a 30-min dynamic followed by a static study at 3 h allowed reliable estimation of both K₁ and V[sub d] avoiding the need for a prolonged (>60-min) continuous dynamic acquisition. The methodology developed should also be applicable to optimizing sampling schedules for other SPECT tracers.
URI: http://hdl.handle.net/10397/1886
ISSN: 0278-0062
DOI: 10.1109/42.712123
Rights: © 1998 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
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