Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/167
| Title: | System for analysis of fabric surface | Authors: | Hu, J Xin, B Guo, Y Newton, E |
Issue Date: | 27-Apr-2004 | Source: | US Patent 6,728,593 B2. Washington, DC: US Patent and Trademark Office, 2004. | Abstract: | A system for analyzing fabric surface appearance includes a feed mechanism for running a fabric over a crest including a frame for holding the fabric bent to form a crest, an image capturing device for capturing profile images of the fabric surface at the crest, and a computer system for manipulating the images. The computer system produces a three-dimensional representation of the fabric surface and identifies characteristics in the three-dimensional representation. The information is compared to reference data to identify a grade for the fabric. | Keywords: | Fabric surface analyzing system | Rights: | Assignee: The Hong Kong Polytechnic University. |
| Appears in Collections: | Patent |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| us6728593b2.pdf | 376.13 kB | Adobe PDF | View/Open |
Page views
108
Last Week
0
0
Last month
Citations as of Jun 22, 2025
Downloads
76
Citations as of Jun 22, 2025
Google ScholarTM
Check
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.