Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/167
| Title: | System for analysis of fabric surface | Authors: | Hu, J Xin, B Guo, Y Newton, E |
Issue Date: | 27-Apr-2004 | Source: | US Patent 6,728,593 B2. Washington, DC: US Patent and Trademark Office, 2004. | Abstract: | A system for analyzing fabric surface appearance includes a feed mechanism for running a fabric over a crest including a frame for holding the fabric bent to form a crest, an image capturing device for capturing profile images of the fabric surface at the crest, and a computer system for manipulating the images. The computer system produces a three-dimensional representation of the fabric surface and identifies characteristics in the three-dimensional representation. The information is compared to reference data to identify a grade for the fabric. | Keywords: | Fabric surface analyzing system | Rights: | Assignee: The Hong Kong Polytechnic University. |
| Appears in Collections: | Patent |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| us6728593b2.pdf | 376.13 kB | Adobe PDF | View/Open |
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