Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/167
DC Field | Value | Language |
---|---|---|
dc.contributor | Institute of Textiles and Clothing | - |
dc.creator | Hu, J | - |
dc.creator | Xin, B | - |
dc.creator | Guo, Y | - |
dc.creator | Newton, E | - |
dc.date.accessioned | 2008-10-30T10:53:55Z | - |
dc.date.available | 2008-10-30T10:53:55Z | - |
dc.identifier.uri | http://hdl.handle.net/10397/167 | - |
dc.language.iso | en | en_US |
dc.rights | Assignee: The Hong Kong Polytechnic University. | en_US |
dc.subject | Fabric surface analyzing system | en_US |
dc.title | System for analysis of fabric surface | en_US |
dc.type | Patent | en_US |
dc.description.otherinformation | US6728593; US6728593 B2; US6728593B2; US6,728,593; US 6,728,593 B2; 6728593; Appl. No. 10/162,696 | en_US |
dcterms.abstract | A system for analyzing fabric surface appearance includes a feed mechanism for running a fabric over a crest including a frame for holding the fabric bent to form a crest, an image capturing device for capturing profile images of the fabric surface at the crest, and a computer system for manipulating the images. The computer system produces a three-dimensional representation of the fabric surface and identifies characteristics in the three-dimensional representation. The information is compared to reference data to identify a grade for the fabric. | - |
dcterms.bibliographicCitation | US Patent 6,728,593 B2. Washington, DC: US Patent and Trademark Office, 2004. | - |
dcterms.issued | 2004-04-27 | - |
dc.description.country | US | - |
dc.description.oa | Version of Record | en_US |
Appears in Collections: | Patent |
Files in This Item:
File | Description | Size | Format | |
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us6728593b2.pdf | 376.13 kB | Adobe PDF | View/Open |
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