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Title: From customer orientation to customer satisfaction : the gap between theory and practice
Authors: Yeung, ACL 
Cheng, TCE 
Chan, LY
Keywords: Operational efficiency
Customer orientation
Customer satisfaction
Process improvement
Issue Date: Feb-2004
Publisher: Institute of Electrical and Electronics Engineers
Source: IEEE transactions on engineering management, Feb. 2004, v. 51, no. 1, p. 85-97 How to cite?
Journal: IEEE transactions on engineering management 
Abstract: The classical quality management theory suggests that different quality improvement practices have a similar positive effect on overall operational efficiency, leading to customer satisfaction. Based on a study of 225 organizations in the electronics industry in Hong Kong, we find that individual quality improvement practice has a specific effect on operational performance, rather than equally improving the overall operational efficiency. Our investigations indicate that customer orientation practices primarily affect time-based efficiency, while process improvement efforts help cost-related performance. On the other hand, emphasizing process-control systems leads to customer satisfaction directly without necessarily improving operations. While supporting the basic assertions of the classical quality management theory, these findings reveal that several problems exist in the practice of quality management in industry, and suggest that a re-direction of several quality management practices seems necessary. This research refines the understanding of quality management by explicating the specific effect of customer orientation and process management on organizational performance.
ISSN: 0018-9391
EISSN: 1558-0040
DOI: 10.1109/TEM.2003.822466
Rights: © 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
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