Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/117483
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Title: HfO₂-based thin films and devices
Authors: Li, X
Park, MH
Dai, JY 
Yin, Y
Issue Date: Nov-2025
Source: Journal of materiomics, Nov. 2025, v. 11, no. 6, 101125
Publisher: Elsevier BV
Journal: Journal of materiomics 
EISSN: 2352-8478
DOI: 10.1016/j.jmat.2025.101125
Rights: © 2025 The Authors. Published by Elsevier B.V. on behalf of The Chinese Ceramic Society. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
The following publication Li, X., Park, M. H., Dai, J.-Y., & Yin, Y. (2025). HfO2-based thin films and devices. Journal of Materiomics, 11(6), 101125 is available at https://doi.org/10.1016/j.jmat.2025.101125.
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