Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/114830
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Title: Atomic-level flat polishing of polycrystalline diamond by combining plasma modification and chemical mechanical polishing
Authors: Yuan, S 
Cheung, CF 
Shokrani, A
Zhan, Z 
Wang, C 
Issue Date: 2025
Source: CIRP annals : manufactering technology, 2025, v. 74, no. 1, p. 441-445
Abstract: This paper presents an atomic-level flat polishing method based on hydroxyl (•OH) oxidation combining plasma modification and chemical mechanical polishing (CMP) of polycrystalline diamond (PCD). The PCD surface was firstly modified using •OH generated by He-based H2O2 plasma leading to the formation of an approximately 30 nm thick uniform oxidation layer on the PCD surface composed of carbon-oxygen mixed layer and oxygen-rich layer. Reactive force field molecular dynamics (ReaxFF MD) simulations explained the plasma modification mechanism. The modified layer was then removed using CMP resulting in an atomic-level flat surface with arithmetical mean height (Sa) of 0.366 nm.
Keywords: Diamond
Plasma
Polishing
Publisher: Elsevier BV
Journal: CIRP annals : manufactering technology 
ISSN: 0007-8506
EISSN: 1726-0604
DOI: 10.1016/j.cirp.2025.03.024
Rights: © 2025 The Authors. Published by Elsevier Ltd on behalf of CIRP. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/)
The following publication Yuan, S., Cheung, C. F., Shokrani, A., Zhan, Z., & Wang, C. (2025). Atomic-level flat polishing of polycrystalline diamond by combining plasma modification and chemical mechanical polishing. CIRP Annals, 74(1), 441–445 is available at https://doi.org/10.1016/j.cirp.2025.03.024.
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