Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/111211
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Title: Study of tunneling mechanism of Au nanocrystals in HfAlO matrix as floating gate memory
Authors: Chan, KC 
Lee, PF 
Dai, JY 
Issue Date: 2-Jun-2008
Source: Applied physics letters, 2 June 2008, v. 92, no. 22, 223105, p. 223105-1 - 223105-3
Abstract: A floating gate memory structure containing HfAlO control gate, self-organized Au nanocrystals NCs , and a HfAlO tunnel layer has been fabricated by pulsed-laser deposition. Owing to the charging effects of Au NCs, a significant threshold voltage shift has been obtained and the memory window up to 10.0 V and stored charge density up to 1 1014/cm2 has been achieved. FowlerNordheim tunneling mechanism is used to analyze the capacitance-voltage characteristics of the trilayer memory structure, and it is found that higher density and smaller size of the Au NCs result in a higher tunneling coefficient and a larger memory window.
Publisher: AIP Publishing LLC
Journal: Applied physics letters 
ISSN: 0003-6951
EISSN: 1077-3118
DOI: 10.1063/1.2936847
Rights: © 2008 American Institute of Physics.
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Chan, K. C., Lee, P. F., & Dai, J. Y. (2008). Study of tunneling mechanism of Au nanocrystals in HfAlO matrix as floating gate memory. Applied Physics Letters, 92(22) and may be found at https://doi.org/10.1063/1.2936847.
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