Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/106010
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Industrial and Systems Engineering | - |
dc.creator | Gu, W | - |
dc.creator | Zhu, Z | - |
dc.creator | Zhu, WL | - |
dc.creator | Lu, L | - |
dc.creator | To, S | - |
dc.creator | Xiao, G | - |
dc.date.accessioned | 2024-04-24T02:01:54Z | - |
dc.date.available | 2024-04-24T02:01:54Z | - |
dc.identifier.issn | 0957-0233 | - |
dc.identifier.uri | http://hdl.handle.net/10397/106010 | - |
dc.language.iso | en | en_US |
dc.publisher | Institute of Physics Publishing | en_US |
dc.rights | © 2018 IOP Publishing Ltd | en_US |
dc.rights | This is the Accepted Manuscript version of an article accepted for publication in Measurement Science and Technology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://www.doi.org/10.1088/1361-6501/aaa519. | en_US |
dc.rights | This manuscript version is made available under the CC-BY-NC-ND 4.0 license (https://creativecommons.org/licenses/by-nc-nd/4.0/) | en_US |
dc.subject | Brittle material | en_US |
dc.subject | Critical depth-of-cut | en_US |
dc.subject | Diamond cutting | en_US |
dc.subject | Differential evolution algorithm | en_US |
dc.title | Identification of the critical depth-of-cut through a 2D image of the cutting region resulting from taper cutting of brittle materials | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.identifier.volume | 29 | - |
dc.identifier.issue | 5 | - |
dc.identifier.doi | 10.1088/1361-6501/aaa519 | - |
dcterms.abstract | An automatic identification method for obtaining the critical depth-of-cut (DoC) of brittle materials with nanometric accuracy and sub-nanometric uncertainty is proposed in this paper. With this method, a two-dimensional (2D) microscopic image of the taper cutting region is captured and further processed by image analysis to extract the margin of generated micro-cracks in the imaging plane. Meanwhile, an analytical model is formulated to describe the theoretical curve of the projected cutting points on the imaging plane with respect to a specified DoC during the whole cutting process. By adopting differential evolution algorithm-based minimization, the critical DoC can be identified by minimizing the deviation between the extracted margin and the theoretical curve. The proposed method is demonstrated through both numerical simulation and experimental analysis. Compared with conventional 2D- and 3D-microscopic-image-based methods, determination of the critical DoC in this study uses the envelope profile rather than the onset point of the generated cracks, providing a more objective approach with smaller uncertainty. | - |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | Measurement science and technology, May 2018, v. 29, no. 5, 55003 | - |
dcterms.isPartOf | Measurement science and technology | - |
dcterms.issued | 2018-05 | - |
dc.identifier.scopus | 2-s2.0-85045632686 | - |
dc.identifier.eissn | 1361-6501 | - |
dc.identifier.artn | 55003 | - |
dc.description.validate | 202404 bcwh | - |
dc.description.oa | Accepted Manuscript | en_US |
dc.identifier.FolderNumber | ISE-0676 | en_US |
dc.description.fundingSource | Others | en_US |
dc.description.fundingText | National Natural Science Foundation of China; Natural Science Foundation of Jiangsu Province; Fundamental Research Funds for the Central Universities | en_US |
dc.description.pubStatus | Published | en_US |
dc.identifier.OPUS | 6834295 | en_US |
dc.description.oaCategory | Green (AAM) | en_US |
Appears in Collections: | Journal/Magazine Article |
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File | Description | Size | Format | |
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Zhu_Identification_Critical_Depth-Of-Cut.pdf | Pre-Published version | 834.75 kB | Adobe PDF | View/Open |
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