Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/100586
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Title: Nanowaveguide enhanced photothermal interferometry spectroscopy
Authors: Qi, Y 
Yang, F 
Lin, Y 
Jin, W 
Ho, HL 
Issue Date: 15-Dec-2017
Source: Journal of lightwave technology, 15 Dec. 2017, v. 35, no. 24, p. 5267-5275
Abstract: We report a new optical nanowaveguide enhanced photothermal (PT) interferometry spectroscopy method for trace molecule detection. Absorption of pump evanescent field of an optical nanowaveguide heats up the trace molecules surrounding the waveguide, causing the temperature of waveguide to rise via thermal conduction and modulating the refractive index and dimension of the nanowaveguide. The phase of a probe beam propagating through the same nanowaveguide is then modulated and can be detected with optic fiber interferometry. Numerical simulation with silica, cyclic transparent optical polymer, and silicon nanowaveguides with proper dimensions can achieve PT index modulation of 10 to over 8000 times that of the commercial HC-1550-02 photonic bandgap fiber. Experiments with 12-mm-long, 800-nm-diamter silica nanofiber demonstrated a lower detection limit of 600 parts per billion (ppb) acetylene at ambient conditions.
Keywords: Fiber optics
Optical sensors
Optical waveguides
Photothermal effects
Publisher: Institute of Electrical and Electronics Engineers
Journal: Journal of lightwave technology 
ISSN: 0733-8724
EISSN: 1558-2213
DOI: 10.1109/JLT.2017.2773121
Rights: ©2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
The following publication Y. Qi, F. Yang, Y. Lin, W. Jin and H. L. Ho, "Nanowaveguide Enhanced Photothermal Interferometry Spectroscopy," in Journal of Lightwave Technology, vol. 35, no. 24, pp. 5267-5275, 15 Dec., 2017 is available at https://doi.org/10.1109/JLT.2017.2773121.
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