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Title: Ni antidot structure via single-step anodization of Al/Ni films
Authors: Ng, SM 
Wong, WC 
Fang, X
Ye, H
Leung, CW 
Issue Date: Dec-2017
Source: Solid-state electronics, Dec. 2017, v. 138, p. 73-78
Abstract: Antidot nanostructures were fabricated on Ni films by a single-step anodization process of magnetron-sputtered Al/Ni/W trilayers. Coercivity and saturation magnetization of the Ni layer were tuned by controlling the anodization time. Transmission electron microscopy was used to investigate the mechanism of the antidot formation process. The present study provides a simple and direct route for the fabrication of magnetic antidot nanostructures for device applications.
Keywords: Anodization
Antidot structure
Publisher: Pergamon Press
Journal: Solid-state electronics 
ISSN: 0038-1101
DOI: 10.1016/j.sse.2017.09.008
Rights: © 2017 Elsevier Ltd. All rights reserved.
© 2017. This manuscript version is made available under the CC-BY-NC-ND 4.0 license https://creativecommons.org/licenses/by-nc-nd/4.0/
The following publication Ng, S. M., Wong, W. C., Fang, X., Ye, H., & Leung, C. W. (2017). Ni antidot structure via single-step anodization of Al/Ni films. Solid-State Electronics, 138, 73-78 is available at https://doi.org/10.1016/j.sse.2017.09.008.
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