Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/88
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | Department of Applied Physics | - |
| dc.contributor | Institute of Textiles and Clothing | - |
| dc.creator | Choi, KF | - |
| dc.creator | Wong, YW | - |
| dc.date.accessioned | 2008-10-29T08:49:39Z | - |
| dc.date.available | 2008-10-29T08:49:39Z | - |
| dc.identifier.uri | http://hdl.handle.net/10397/88 | - |
| dc.language.iso | en | en_US |
| dc.rights | Assignee: The Hong Kong Polytechnic University. | en_US |
| dc.subject | Lateral yarn density distribution | en_US |
| dc.subject | Measuring apparatus | en_US |
| dc.title | Measurement of lateral yarn density distribution | en_US |
| dc.type | Patent | en_US |
| dc.description.otherinformation | US6577706; US6577706 B2; US6577706B2; US6,577,706; US 6,577,706 B2; 6577706; Appl. No. 09/921,271 | en_US |
| dcterms.abstract | An apparatus for measuring the lateral yarn density distribution of a yarn uses selected X-ray radiation. Radiation absorption is determined in a number of narrow planes across the yarn and in two or more rotational orientations. The measuring takes place without any damage to or physical interference with the yarn. | - |
| dcterms.bibliographicCitation | US Patent 6,577,706 B2. Washington, DC: US Patent and Trademark Office, 2003. | - |
| dcterms.issued | 2003-06-10 | - |
| dc.description.country | US | - |
| dc.description.oa | Version of Record | en_US |
| Appears in Collections: | Patent | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| us6577706b2.pdf | 374.33 kB | Adobe PDF | View/Open |
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