Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/167
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dc.contributorInstitute of Textiles and Clothing-
dc.creatorHu, J-
dc.creatorXin, B-
dc.creatorGuo, Y-
dc.creatorNewton, E-
dc.date.accessioned2008-10-30T10:53:55Z-
dc.date.available2008-10-30T10:53:55Z-
dc.identifier.urihttp://hdl.handle.net/10397/167-
dc.language.isoenen_US
dc.rightsAssignee: The Hong Kong Polytechnic University.en_US
dc.subjectFabric surface analyzing systemen_US
dc.titleSystem for analysis of fabric surfaceen_US
dc.typePatenten_US
dc.description.otherinformationUS6728593; US6728593 B2; US6728593B2; US6,728,593; US 6,728,593 B2; 6728593; Appl. No. 10/162,696en_US
dcterms.abstractA system for analyzing fabric surface appearance includes a feed mechanism for running a fabric over a crest including a frame for holding the fabric bent to form a crest, an image capturing device for capturing profile images of the fabric surface at the crest, and a computer system for manipulating the images. The computer system produces a three-dimensional representation of the fabric surface and identifies characteristics in the three-dimensional representation. The information is compared to reference data to identify a grade for the fabric.-
dcterms.bibliographicCitationUS Patent 6,728,593 B2. Washington, DC: US Patent and Trademark Office, 2004.-
dcterms.issued2004-04-27-
dc.description.countryUS-
dc.description.oaVersion of Recorden_US
Appears in Collections:Patent
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