Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/6563
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Title: Effective bias removal for fringe projection profilometry using the dual-tree complex wavelet transform
Authors: Ng, WWL
Lun, PKD 
Issue Date: 20-Aug-2012
Source: Applied optics, 20 Aug. 2012, v. 51, no. 24, p. 5909-5916
Abstract: When reconstructing the three-dimensional (3D) object height profile using the fringe projection profilometry (FPP) technique, the light intensity reflected from the object surface can yield abruptly changing bias in the captured fringe image, which leads to severe reconstruction error. The traditional approach tries to remove the bias by suppressing the zero spectrum of the fringe image. It is based on the assumption that the aliasing between the frequency spectrum of the bias, which is around the zero frequency, and the frequency spectrum of the fringe is negligible. This, however, is not the case in practice. In this paper, we propose a novel (to our knowledge) technique to eliminate the bias in the fringe image using the dual-tree complex wavelet transform (DT-CWT). The new approach successfully identifies the features of bias, fringe, and noise in the DT-CWT domain, which allows the bias to be effectively extracted from a noisy fringe image. Experimental results show that the proposed algorithm is superior to the traditional methods and facilitates accurate reconstruction of objects’ 3D models.
Keywords: Algorithms
Profilometry
Spectroscopy
Publisher: Optical Society of America
Journal: Applied optics 
ISSN: 1559-128X
EISSN: 2155-3165
DOI: 10.1364/AO.51.005909
Rights: © 2012 Optical Society of America. This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-24-5909. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
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