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Title: The effect of Fe substitution on pyroelectric properties of 0.62Pb(Mg[sub ⅓]Nb[sub ⅔])O₃-0.38PbTiO₃ single crystals
Authors: Wan, X
Chew, K
Chan, HLW 
Choy, CL
Zhao, X
Luo, H
Issue Date: 9-Mar-2005
Source: Journal of applied physics, 9 Mar. 2005, v. 97, 064105, p. 1-4
Abstract: Fe-doped 0.62Pb(Mg[sub ⅓]Nb[sub ⅔]O₃-0.38PbTiO₃ (PMN-0.38PT) single crystals with two different dopant concentrations, 0.2 and 1.0 mol %, were grown by a modified Bridgman technique. The effect of Fe substitution on dielectric and pyroelectric properties was examined. The dielectric constant of the 0.2 mol % Fe-doped PMN-0.38PT single crystal was controlled successfully, indicating the possibility of tuning the dielectric properties by doping with a small concentration of iron ions. The mechanism of doping effect was also discussed based on the principles of crystal chemistry. The pyroelectric response of the single crystals was measured using a dynamic method from 20 to 50 °C. Compared with the 1.0 mol % Fe-doped single crystal, the 0.2 mol % Fe-doped sample possesses the better pyroelectric properties. At room temperature, the pyroelectric coefficient and detectivity figure of merit (F[sub D) for the 0.2 mol % Fe-doped sample are 568 µC/m² K and 53 µPa[sup −1/2], respectively, and they increase slightly with temperature increasing. These excellent pyroelectric properties as well as being able to produce large-size and high-quality single crystals make this kind of single crystal a promising candidate for high-performance infrared detectors and other pyroelectric applications.
Keywords: Lead compounds
Ferroelectric materials
Pyroelectricity
Permittivity
Dielectric losses
Impurity distribution
Crystal chemistry
Publisher: American Institute of Physics
Journal: Journal of applied physics 
ISSN: 0021-8979
EISSN: 1089-7550
Rights: © 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in X. Wan et al. J. Appl. Phys. 97, 064105 (2005) and may be found at http://link.aip.org/link/?jap/97/064105
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