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Title: Growth and pyroelectric property of 0.2 mol % Fe-doped Pb(Mg[sub ⅓]Nb[sub ⅔])O₃-0.38PbTiO₃ single crystals measured by a dynamic technique
Authors: Wan, X
Tang, X
Wang, J
Chan, HLW 
Choy, CL 
Luo, H
Issue Date: 7-Jun-2004
Source: Applied physics letters, 7 June 2004, v. 84, no. 23, p.4711-4713
Abstract: To develop a high-performance pyroelectric infrared detector, large-size and high-quality 0.2 mol% Fe-doped Pb(Mg[sub ⅓]Nb[sub ⅔])O₃-0.38PbTiO₃ single crystals have been grown by a modified Bridgman technique with a seed crystal. At 50 Hz, the doped single crystal showed a lower dielectric constant of 310 compared with the pure one. A low dielectric loss of 0.0067 was also obtained by doping with small concentration of iron ions. Piezoelectric coefficient (d[sub 33]) of <001> oriented sample was ~260 pC/N. The pyroelectric properties and their temperature dependence were measured by the dynamic technique. At room temperature, the pyroelectric coefficient and calculated detectivity figure of merit F[sub D] are 568 µC/m² K and 53 µPa[sup -½], respectively. The values of current response figure of merit F[sub i] and voltage response figure of merit F[sub v] are 227.2 pm/V and 0.083 m²/C, respectively. These excellent pyroelectric properties as well as being able to produce large-size and high-quality single crystals make this kind of single crystal very promising for high-performance infrared detectors and other pyroelectric applications.
Keywords: Lead compounds
Iron
Crystal growth from melt
Ferroelectric materials
Dielectric losses
Impurities
Permittivity
Pyroelectricity
Pyroelectric detectors
Infrared detectors
Publisher: American Institute of Physics
Journal: Applied physics letters 
ISSN: 0003-6951
EISSN: 1077-3118
Rights: © 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in X. Wan et al. Appl. Phys. Lett. 84, 4711 (2004) and may be found at http://link.aip.org/link/?apl/84/4711
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