Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/170
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Title: Three dimensional measurement, evaluation and grading system for fabric/textile structure/garment appearance
Authors: Hu, J 
Xin, B
Issue Date: 11-Jan-2005
Source: US Patent 6,842,532 B2. Washington, DC: US Patent and Trademark Office, 2005.
Abstract: A method of three dimensional measurement, evaluation, and grading system for fabric/textile structure/garment appearance, based an values P and Q, is carried out using a fixed digital camera positioned above a piece of the fabric, shining at least two different parallel light beams from inclined directions onto the surface of the fabric and capturing different reflected images of the surface with the camera. The captured images are analysed to derive certain parameters relevant to the appearance. In particular, values of P+Q may be used in a grading evaluation, where P and Q are summations of the surface gradients for a plurality of evenly distributed points in an x direction and in a y direction of the surface, respectively.
Keywords: Three dimensional measurement, evaluation and grading system
3-D measurement
Fabric and textile structure
Garment appearance
Rights: Assignee: The Hong Kong Polytechnic University.
Appears in Collections:Patent

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