Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/9834
Title: Epitaxial growth and optical properties of Sr2-xCaxNaNb5O15 thin films by pulsed laser deposition
Authors: Zhang, YL
Mak, CL 
Wong, KH
Choy, CL
Keywords: Pulsed laser deposition
Optical properties
Ferroelectric materials
Epitaxial growth
Issue Date: 2004
Publisher: Elsevier
Source: Thin solid films, 2004, v. 449, no. 1-2, p. 63-66 How to cite?
Journal: Thin solid films 
Abstract: High-quality Sr2-xCaxNaNbxO15 (SCNN) thin films have been epitaxially grown on MgO(0 0 1) substrates by pulsed laser deposition (PLD) technique for the first time. The thickness of the films is in the range of 600-800 nm. Their structural qualities and surface morphology were studied by X-ray diffraction and scanning electron microscopy. theta-2theta scans indicate that single crystalline SCNN layers with (0 0 1) orientation perpendicular to the substrate plane were obtained. phi-scans on the (2 2 1) plane confirm that the unit cell of SCNN films rotates in the plane of the film by +/-17.8degrees with respect to the MgO substrate unit cell. Optical studies by optical transmittance measurements were carried out in the spectral range of 200-900 nm. In the analysis of the measured optical transmittance spectra, a single electronic oscillator model was adopted to represent the refractive index and the extinction coefficient of the SCNN films. Our results suggest that PLD is a promising technique in preparing high-quality epitaxial SCNN films for electro-optic device applications.
URI: http://hdl.handle.net/10397/9834
ISSN: 0040-6090
EISSN: 1879-2731
DOI: 10.1016/S0040-6090(03)01486-X
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