Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/9217
Title: Simulation of thickness dependence in ferroelectric thin films
Authors: Li, KT
Lo, VC
Keywords: Ferroelectric thin films
Coercive field
Thickness dependence
Two-dimensional four-state Potts model
Remanent polarization
Issue Date: 2004
Publisher: Pergamon Press
Source: Solid state communications, 2004, v. 132, no. 1, p. 49-54 How to cite?
Journal: Solid state communications 
Abstract: The thickness dependence of coercive field (EC) and remanent polarization (Pr) in ferroelectric thin films has been numerically simulated using a two-dimensional four-state Potts model. In this model, each of the dipoles in the film is assigned to one of the four states corresponding to the four different mutually perpendicular orientations. Neighboring dipoles with the same orientation are then grouped together to form a domain. Four different kinds of domains exist. In the presence of the surface layer near the electrode/film interface, the thickness dependence of both coercive field and remanent polarization are simulated.
URI: http://hdl.handle.net/10397/9217
ISSN: 0038-1098
EISSN: 1879-2766
DOI: 10.1016/j.ssc.2004.07.013
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