Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/8896
Title: Signed and accurate measurement of phase offset in optical DPSK demodulator
Authors: Zhao, J
Lau, APT 
Lu, C 
Tam, HY 
Wai, PKA 
Keywords: Chromatic dispersion (CD)
Delay interferometer (DI)
Delay-tap sampling
Differential phase-shift keying (DPSK)
Optical fiber communication
Performance monitoring
Phase offset
Issue Date: 2010
Publisher: Institute of Electrical and Electronics Engineers
Source: IEEE photonics technology letters, 2010, v. 22, no. 14, 5458064, p. 1018-1020 How to cite?
Journal: IEEE photonics technology letters 
Abstract: A signed and accurate phase offset estimation method of the delay interferometer (DI) for the direct detection differential phase-shift keying system based on a delay-tap sampling technique has been demonstrated. A chromatic dispersion offset module was introduced to help the phase offset measurement. The proposed method can not only measure the value but also distinguish the polarity of phase offset of DI. The measurement sensitivity can reach ±4° and measurement range can reach ±75°. The simulation and experimental measurement results are in close agreement with each other.
URI: http://hdl.handle.net/10397/8896
ISSN: 1041-1135
EISSN: 1941-0174
DOI: 10.1109/LPT.2010.2049012
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