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Title: Measurement of lateral yarn density distribution
Authors: Choi, KF
Wong, YW
Issue Date: 10-Jun-2003
Source: US Patent 6,577,706 B2. Washington, DC: US Patent and Trademark Office, 2003.
Abstract: An apparatus for measuring the lateral yarn density distribution of a yarn uses selected X-ray radiation. Radiation absorption is determined in a number of narrow planes across the yarn and in two or more rotational orientations. The measuring takes place without any damage to or physical interference with the yarn.
Keywords: Lateral yarn density distribution
Measuring apparatus
Rights: Assignee: The Hong Kong Polytechnic University.
Appears in Collections:Patent

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