Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/88
| Title: | Measurement of lateral yarn density distribution | Authors: | Choi, KF Wong, YW |
Issue Date: | 10-Jun-2003 | Source: | US Patent 6,577,706 B2. Washington, DC: US Patent and Trademark Office, 2003. | Abstract: | An apparatus for measuring the lateral yarn density distribution of a yarn uses selected X-ray radiation. Radiation absorption is determined in a number of narrow planes across the yarn and in two or more rotational orientations. The measuring takes place without any damage to or physical interference with the yarn. | Keywords: | Lateral yarn density distribution Measuring apparatus |
Rights: | Assignee: The Hong Kong Polytechnic University. |
| Appears in Collections: | Patent |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| us6577706b2.pdf | 374.33 kB | Adobe PDF | View/Open |
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