Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/8477
Title: Simple transmission ellipsometry method for measuring the electric-field-induced birefringence in PLZT thin films
Authors: Wang, J
Wang, DY
Li, F
Tang, XG
Chan, HLW 
Mo, D
Choy, CL 
Issue Date: 2004
Publisher: Springer
Source: Journal of materials science, 2004, v. 39, no. 5, p. 1805-1807 How to cite?
Journal: Journal of materials science 
Abstract: The electric-field-induced birefringe in lanthanum-doped lead zirconate-titanate (PLZT) thin films was investigated simple transmission ellipsometry method. It was observed that the natural birefringe was almost negligible at the zero electric field. It was found that the film had a pure pervoskite structure with a random orientation. The results show that birefringe reaches 6×10-3 at the maximum applied field of 15kV/mm.
URI: http://hdl.handle.net/10397/8477
ISSN: 0022-2461
EISSN: 1573-4803
DOI: 10.1023/B:JMSC.0000016190.65639.1d
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