Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/81737
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dc.contributorDepartment of Industrial and Systems Engineering-
dc.creatorIbrahim, MSen_US
dc.creatorFan, JJen_US
dc.creatorYung, WKCen_US
dc.creatorWu, ZYen_US
dc.creatorSun, Ben_US
dc.date.accessioned2020-02-10T12:28:54Z-
dc.date.available2020-02-10T12:28:54Z-
dc.identifier.urihttp://hdl.handle.net/10397/81737-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rightsThis work is licensed under a Creative Commons Attribution 4.0 License. For more information, seehttps://creativecommons.org/licenses/by/4.0/en_US
dc.rightsThe following publication M. S. Ibrahim, J. Fan, W. K. C. Yung, Z. Wu and B. Sun, "Lumen Degradation Lifetime Prediction for High-Power White LEDs Based on the Gamma Process Model," in IEEE Photonics Journal, vol. 11, no. 6, pp. 1-16, Dec. 2019, Art no. 8201316 is available at https://dx.doi.org/10.1109/JPHOT.2019.2950472en_US
dc.subjectLight-emitting diodes (LEDs)en_US
dc.subjectLuminous flux degradationen_US
dc.subjectGamma distributed degradation (GDD)en_US
dc.subjectMaximum likelihood estimationen_US
dc.subjectMethod of momentsen_US
dc.titleLumen degradation lifetime prediction for high-power white LEDs based on the gamma process modelen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage1en_US
dc.identifier.epage16en_US
dc.identifier.volume11en_US
dc.identifier.issue6en_US
dc.identifier.doi10.1109/JPHOT.2019.2950472en_US
dcterms.abstractNowadays, due to the advancement of design and manufacturing technology, there are many consumer products with high reliability. Similarly, the competition in the business sector influences the product development time to become shorter and that makes it difficult for manufacturers to evaluate the reliability of current products before new products are released to the market. This phenomenon is manifested in the lighting industry, especially for the high power white light-emitting diodes (LEDs) as these products have a long lifetime and high reliability. Currently, the standard to predict the lifetime of LEDs is based on a deterministic nonlinear least squares method which has low prediction accuracy. To overcome this, degradation models are being used to study the reliability of such products, considering the uncertainties and the quality characteristics whose degradation over a period of time can be related to the product lifetime. A stochastic approach based on gamma distributed degradation (GDD) is proposed in this study to estimate the long-term lumen degradation lifetime of phosphor-converted white LEDs. An accelerated thermal degradation test was designed to gather luminous flux degradation data which was analyzed based on maximum likelihood estimation (MLE) and the method of moments (MM) to estimate the parameters for the GDD model. The MLE method has shown superiority over MM in terms of the estimation of the model parameters due to its iterative algorithm being likely to find the optimal estimation. The lifetime prediction results show that the accuracy of the proposed method is much better than the TM-21 nonlinear least squares (NLS) approach which makes it promising for future industrial applications.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationIEEE photonics journal, Dec. 2019, v. 11, no. 6, 8201316, p. 1-16en_US
dcterms.isPartOfIEEE photonics journalen_US
dcterms.issued2019-
dc.identifier.isiWOS:000502032200001-
dc.identifier.scopus2-s2.0-85077513555-
dc.identifier.eissn1943-0655en_US
dc.identifier.artn8201316en_US
dc.description.validate202002 bcrc-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_Scopus/WOSen_US
dc.description.pubStatusPublisheden_US
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