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Title: A study of a priori knowledge-assisted multi-scopic metrology for freeform surface measurement
Authors: Li, D 
Cheung, CF 
Wang, B 
Liu, M 
Issue Date: 2018
Source: Procedia CIRP, 2018, v. 75, p. 337-342
Abstract: The traditional multi-scopic metrology system makes use of a micro lens array to capture a raw 3D-image of the target surface in a single snapshot through a CCD camera under normal illumination. However, the resolution of the system depends on the matching precision and efficiency of disparity information during the processing of the 3D raw data. In this paper, the a priori knowledge-assisted multi-scopic metrology is studied and an a priori knowledge-assisted multi-scopic metrology system is established which makes use of patterned illumination custom-designed based on the a priori knowledge of the target freeform surface profile. The a priori knowledge provides abundant versatile known information for a precise and efficient matching process so as to enhance the measuring performance. A customized disparity matching process based on the a priori knowledge is developed accordingly for high-resolution 3D surface reconstruction. An experimental study for measuring freeform surface is conducted to verify the feasibility of the proposed a priori knowledge-assisted multi-scopic metrology system through the comparison between that using normal illumination and a priori knowledge-assisted patterned illumination.
Keywords: A priori knowledge-assisted
Autostereoscopy
Freeform surface
Multi-scopic metrology
Precision surface measurement
Publisher: Elsevier
Journal: Procedia CIRP 
ISSN: 2212-8271
DOI: 10.1016/j.procir.2018.05.002
Description: 15th CIRP Conference on Computer Aided Tolerancing, CIRP CAT 2018, Italy, 11-13 June 2018
Rights: © 2018 The Authors. Published by Elsevier B.V. Peer-review under responsibility of the scientific committee of the 15th CIRP Conference on Computer Aided Tolerancing - CIRP CAT 2018.
The following publication Li, D., Cheung, C. F., Wang, B., & Liu, M. (2018). A study of a priori knowledge-assisted multi-scopic metrology for freeform surface measurement. Procedia CIRP, 75, 337-342 is available at https://doi.org/10.1016/j.procir.2018.05.002
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