Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/7920
Title: Hydrogen-induced degradation in SrTiO3-based grain boundary barrier layer ceramic capacitors
Authors: Shen, ZJ
Chen, WP
Zhu, K
Zhuang, Y
Hu, YM
Wang, Y 
Chan, HLW 
Keywords: Failure analysis
Dielectric properties
BaTiO3 and titanates
Capacitors
Issue Date: 2009
Publisher: Pergamon Press
Source: Ceramics international, 2009, v. 35, no. 3, p. 953-956 How to cite?
Journal: Ceramics international 
Abstract: Hydrogen-induced degradation in SrTiO3-based grain boundary barrier layer ceramic capacitors was studied through electrochemical hydrogen charging, in which the capacitors were placed in 0.01 M NaOH solution with hydrogen deposited on their electrodes from the electrolysis of water. The properties of the capacitors were greatly degraded after 0.5 h of treatment: The capacitance was dramatically decreased and the dielectric loss was dramatically increased over the frequency range of 102-105 Hz, the leakage current was increased by orders of magnitude. It was proposed that atomic hydrogen diffused relatively easily along the grain boundaries and induced a reduction reaction to the grain boundary layer, which resulted in the degradation observed. Hydrogen-induced degradation is more serious in SrTiO3-based grain boundary barrier layer ceramic capacitors than in other ceramic capacitors and great efforts should be made to prevent hydrogen-induced degradation in them.
URI: http://hdl.handle.net/10397/7920
ISSN: 0272-8842
EISSN: 1873-3956
DOI: 10.1016/j.ceramint.2008.04.005
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