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Title: Exploit every bit : effective caching for high-dimensional nearest neighbor search (Extended abstract)
Authors: Tang, B 
Yiu, ML 
Hua, KA
Issue Date: 2017
Publisher: Institute of Electrical and Electronics Engineers
Source: IEEE 33rd International Conference on Data Engineering (ICDE), San Diego, CA, US, Apr 19-22, 2017, p. 45-46 How to cite?
ISBN: 978-1-5090-6543-1
ISSN: 1084-4627
DOI: 10.1109/ICDE.2017.29
Appears in Collections:Conference Paper

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