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Title: Utilizing NVDIMM to alleviate the I/O performance gap for big data workloads
Authors: Shao, ZL 
Issue Date: 2017
Publisher: Institute of Electrical and Electronics Engineers
Source: International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, Apr 24-27, 2017, 2017 How to cite?
ISBN: 978-1-5090-3969-2
ISSN: 2474-2724
Appears in Collections:Conference Paper

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