Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/74706
Title: Distance metric learning for pattern recognition [Editorial]
Authors: Lu, J
Wang, R
Mian, A
Kumar, A 
Sarkar, S
Issue Date: 2018
Publisher: Elsevier
Source: Pattern recognition, 2018, v. 75, p. 1-3 How to cite?
Journal: Pattern recognition 
Abstract: [No abstract available]
URI: http://hdl.handle.net/10397/74706
ISSN: 0031-3203
EISSN: 1873-5142
DOI: 10.1016/j.patcog.2017.10.032
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

1
Last Week
0
Last month
Citations as of Jan 11, 2019

Page view(s)

45
Citations as of Jan 14, 2019

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.