Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/69515
Title: Digital -based technlolgy for fabric structure analysis
Authors: Xin, B 
Hu, J 
Baciu, G 
Yu, X 
Keywords: Image analysis
Weave pattern
Dual side scanning
Active grid model
Fabric structure
Issue Date: 2011
Publisher: Woodhead Pub. in association with the Textile Institute
Source: In J Hu (Ed.), Computer technology for textiles and apparel, p. 23-44. Cambridge: Woodhead Pub. in association with the Textile Institute, 2011 How to cite?
Abstract: In this chapter, typical applications of image-based technologies used for the analysis of fabric structure and texture are summarized and discussed. Among them, a new digital method, based on the dual side scanning and active grid model (AGM), is introduced to demonstrate how to identify the weave pattern of woven fabrics. Some preliminary experiments and discussions are also included to validate this method.
URI: http://hdl.handle.net/10397/69515
ISBN: 1845697294 (hb)
9781845697297 (hb)
DOI: 10.1533/9780857093608.1.23
Appears in Collections:Book Chapter

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