Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/68426
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dc.contributorDepartment of Health Technology and Informatics-
dc.creatorZheng, YP-
dc.creatorLu, MH-
dc.date.accessioned2017-08-22T05:55:00Z-
dc.date.available2017-08-22T05:55:00Z-
dc.identifier.urihttp://hdl.handle.net/10397/68426-
dc.language.isoenen_US
dc.rightsAssignee: The Hong Kong Polytechnic Univeristy.en_US
dc.titleNon-contact measurement of material propertyen_US
dc.typePatenten_US
dc.description.otherinformationUS7124636; US7124636 B2; US7124636B2; US7,124,636; US 7,124,636 B2; 7124636; Appl. No. 10/954,022en_US
dcterms.abstractA process for measuring a property of a sample is provided. The sample has an external surface enclosing an inner portion, and firstly, the sample is deformed by applying a predetermined non-contact pressure to deform a portion of the sample. Then a signal, which is at least suitable for transmission over the air, is directed towards the deformed portion of the sample, and further propagates through the external surface and the inner portion of the sample. Then an echoed signal generated by the inner portion of the sample in response to the propagation of the signal is detected; wherein the echoed signal incorporates information relating to a deformation of the inner portion of the sample. The property of the sample is determined from the deformation of the inner portion of the sample.-
dcterms.bibliographicCitationUS Patent 7,124,636 B2. Washington, DC: US Patent and Trademark Office, 2006.-
dcterms.issued2006-10-24-
dc.description.countryUS-
dc.identifier.rosgroupidr32764-
dc.description.ros2006-2007 > Other Outputs > Patents granted-
dc.description.oaVersion of Recorden_US
Appears in Collections:Patent
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