Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/68412
Title: Three dimensional measurement, evaluation and grading system for fabric/textile structure/garment appearance
Authors: Hu, JL 
Xin, B
Issue Date: 11-Jan-2005
Source: US Patent 6,842,532 B2. Washington, DC: US Patent and Trademark Office, 2005. How to cite?
Abstract: A method of three dimensional measurement, evaluation, and grading system for fabric/textile structure/garment appearance, based an values P and Q, is carried out using a fixed digital camera positioned above a piece of the fabric, shining at least two different parallel light beams from inclined directions onto the surface of the fabric and capturing different reflected images of the surface with the camera. The captured images are analysed to derive certain parameters relevant to the appearance. In particular, values of P+Q may be used in a grading evaluation, where P and Q are summations of the surface gradients for a plurality of evenly distributed points in an x direction and in a y direction of the surface, respectively.
URI: http://hdl.handle.net/10397/68412
Rights: Assignee: The Hong Kong Polytechnic Univeristy.
Appears in Collections:Patent

Files in This Item:
File Description SizeFormat 
us6842532b2.pdf461.98 kBAdobe PDFView/Open
Show full item record

Page view(s)

6
Last Week
1
Last month
Checked on Nov 19, 2017

Google ScholarTM

Check



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.