Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/67001
Title: Effort-aware just-in-time defect prediction : simple unsupervised models could be better than supervised models
Authors: Yang, YB
Zhou, YM
Liu, JP
Zhao, YY
Lu, HM
Xu, L
Xu, BW
Leung, H 
Keywords: Defect
Prediction
Changes
Just-in-time
Effort-aware
Issue Date: 2016
Publisher: Association for Computing Machinary
Source: FSE'16 : Proceedings of the 2016 24th ACM Sigsoft International Symposium on Foundations of Software Engineering, p. 157-168 How to cite?
URI: http://hdl.handle.net/10397/67001
ISBN: 978-1-4503-4218-6
DOI: 10.1145/2950290.2950353
Appears in Collections:Conference Paper

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