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Title: Investigating the necessity of acceleration in a degradation test
Authors: Hong, LQ
Ye, ZS
Zhao, XQ 
Keywords: Degradation Tests
Acceleration Relation index
Necessity of Acceleration
Stochastic Process Models
Issue Date: 2016
Publisher: Institute of Electrical and Electronics Engineers
Source: 2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Dec 4-7, 2016, Bali, Indonesia, p. 546-550 How to cite?
ISBN: 978-1-5090-3665-3
Appears in Collections:Conference Paper

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