Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/66595
Title: PLACE : physical layer cardinality estimation for large-scale RFID systems
Authors: Hou, YX
Ou, JJ
Zheng, YQ 
Li, M
Keywords: RFID
Cardinality estimation
Physical layer
Issue Date: 2016
Publisher: Institute of Electrical and Electronics Engineers
Source: IEEE/ACM transactions on networking, Oct. 2016, v. 24, no. 5, p. 2702-2714 How to cite?
Journal: IEEE/ACM transactions on networking 
URI: http://hdl.handle.net/10397/66595
ISSN: 1063-6692
DOI: 10.1109/TNET.2015.2481999
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

2
Last Week
0
Last month
Citations as of May 18, 2018

WEB OF SCIENCETM
Citations

1
Last Week
0
Last month
Citations as of May 20, 2018

Page view(s)

47
Last Week
0
Last month
Citations as of May 21, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.