Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/66409
Title: Prognostics-based qualification of high-power white LEDs using Levy process approach
Authors: Yung, KC 
Sun, B
Jiang, XP
Keywords: Light-emitting diodes
Qualification
Prognostics
Reliability
Anomaly detection
Levy process
Issue Date: 2017
Publisher: Academic Press
Source: Mechanical systems and signal processing, 1 Jan. 2017, v. 82, p. 206-216 How to cite?
Journal: Mechanical systems and signal processing 
Abstract: Due to their versatility in a variety of applications and the growing market demand, high power white light-emitting diodes (LEDs) have attracted considerable attention. Reliability qualification testing is an essential part of the product development process to ensure the reliability of a new LED product before its release. However, the widely used IES-TM-21 method does not provide comprehensive reliability information. For more accurate and effective qualification, this paper presents a novel method based on prognostics techniques. Prognostics is an engineering technology predicting the future reliability or determining the remaining useful lifetime (RUL) of a product by assessing the extent of deviation or degradation from its expected normal operating conditions. A Levy subordinator of a mixed Gamma and compound Poisson process is used to describe the actual degradation process of LEDs characterized by random sporadic small jumps of degradation degree, and the reliability function is derived for qualification with different distribution forms of jump sizes. The IES LM-80 test results reported by different LED vendors are used to develop and validate the qualification methodology. This study will be helpful for LED manufacturers to reduce the total test time and cost required to qualify the reliability of an LED product.
URI: http://hdl.handle.net/10397/66409
ISSN: 0888-3270
EISSN: 1096-1216
DOI: 10.1016/j.ymssp.2016.05.019
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