Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/65459
Title: Measuring the charge of a single dielectric nanoparticle using a high- Q optical microresonator
Authors: Chen, YL
Jin, WL
Xiao, YF
Zhang, X 
Issue Date: 2016
Publisher: American Physical Society
Source: Physical review applied, 2016, v. 6, no. 4, 44021 How to cite?
Journal: Physical review applied 
Abstract: Measuring the charge of a nanoparticle is of great importance in many fields including optics, astronomy, biochemistry, atmospheric science, environmental engineering, and dusty plasma. Here, we propose to use a high-Q whispering-gallery-mode (WGM) optical microresonator to detect the surface and bulk charge of a dielectric nanoparticle. Because of the modification of nanoparticle conductivity induced by the surplus electrons, both the coupling strength between the nanoparticle and the WGM and the dissipation changes compared with the case of a neutral nanoparticle. The charge density can be inferred from the transmission spectrum of the WGM microresonator. By monitoring the mode splitting, the linewidth broadening or the resonance dip value of the transmission spectrum, surface (bulk) electron density as low as 0.007 nm-2 (0.001 nm-3) can be detected for nanoparticles with negative (positive) electron affinity. The high sensitivity is attributed to the ultranarrow resonance linewidth and small mode volume of the microresonator.
URI: http://hdl.handle.net/10397/65459
ISSN: 2331-7019
DOI: 10.1103/PhysRevApplied.6.044021
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

1
Last Week
0
Last month
Citations as of Sep 11, 2017

Page view(s)

17
Checked on Sep 18, 2017

Google ScholarTM

Check

Altmetric



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.