Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/64451
Title: An overview of methods and tools in technology audit
Authors: Hui, HM
Man, HC 
Chan, KC 
Chan, LC 
Issue Date: 2006
Publisher: Institute of Industrial Engineers
Source: Annual journal of IIE Hong Kong, 2006, v. 26, p. 71-79 How to cite?
Journal: Annual journal of IIE Hong Kong 
URI: http://hdl.handle.net/10397/64451
ISSN: 1609-3208
Appears in Collections:Journal/Magazine Article

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