Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/62776
Title: Thickness dependence on the coercive field in ferroelectric thin films
Authors: Li, KT
Lo, VC
Keywords: Thickness dependence
Four-state Potts model
Coercive field
Remanent polarization
Ferroelectric thin films
Issue Date: 2004
Publisher: Ceramic Society of Japan
Source: Journal of the Ceramic Society of Japan (Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi), 2004, v. 112, no. 5, Supplement 112-1, PacRim5 Special Issue, p. S439-S443 How to cite?
Journal: Journal of the Ceramic Society of Japan (Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi) 
Abstract: Thickness dependence of coercive field (EC) and remanent polarization (Pr) in ferroelectric thin films has been numerically simulated using four-state Potts model. In this model, four mutually perpendicular dipole-orientations result in four different kinds of domains. The thickness dependence is induced by the influence of the surface dipoles. These dipoles have slightly different physical parameters due to the interfacial effects. The simulation result shows the existence of a maximum coercive field at the critical thickness (dC) for the coercive field against thickness (d) curve. For the thickness d<dC, EC increases with d. On the other hand, for d>dC, an opposite trend can be obtained.
URI: http://hdl.handle.net/10397/62776
ISSN: 1882-0743 (print)
1348-6535 (online)
Appears in Collections:Journal/Magazine Article

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