Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/61303
Title: An endurance-aware metadata allocation strategy for MLC NAND flash memory storage systems
Authors: Huang, M
Liu, Z
Qiao, L
Wang, Y
Shao, Z 
Keywords: Metadata
MLC
NAND flash memory
Reliability
Shared page
Issue Date: 2016
Publisher: Institute of Electrical and Electronics Engineers
Source: IEEE transactions on computer-aided design of integrated circuits and systems, 2016, v. 35, no. 4, 7229298, p. 691-694 How to cite?
Journal: IEEE transactions on computer-aided design of integrated circuits and systems 
Abstract: This paper presents a reliability-aware metadata allocation strategy called scatter-single-level cell (SLC) for multiple-level cell (MLC) NAND flash memory storage systems. In scatter-SLC, metadata is kept in least significant bit (LSB) pages and corresponding most significant bit (MSB) pages are bypassed. Without partitioning SLC and MLC blocks, scatter-SLC can eliminate the unbalanced lifetime between SLC and MLC blocks while achieving the similar error rate as the method to store metadata in SLC blocks. We implemented scatter-SLC on a real-hardware platform. The experiment results show that scatter-SLC can reduce uncorrectable page errors by 93.54% while incurring less than 1% time overhead on average compared with the previous work.
URI: http://hdl.handle.net/10397/61303
ISSN: 0278-0070
EISSN: 1937-4151
DOI: 10.1109/TCAD.2015.2474394
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

10
Last Week
0
Last month
Citations as of Nov 15, 2017

WEB OF SCIENCETM
Citations

8
Last Week
0
Last month
Citations as of Nov 16, 2017

Page view(s)

36
Last Week
1
Last month
Checked on Nov 20, 2017

Google ScholarTM

Check

Altmetric



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.