Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/60129
Title: Detecting defects in textile products based on band-pass filtering techniques
Authors: Choi, KF
Gong, YN
Yeung, KW
Issue Date: 2004
Publisher: Emerald Group Publishing Limited
Source: Research journal of textile and apparel, 2004, v. 8, no. 2, p. 21-27 How to cite?
Journal: Research journal of textile and apparel 
Abstract: Two dimensional band-pass filters can be used to enhance the edges of the defects contained in fabric images. In this paper, we designed two types of 2D band-pass filters for the automatic detection of defects. One is the matched Gabor filter, and the other is the matched Mexican hat wavelet. Experiments show that the matched Gabor filter is more suitable for defects of higher frequency, while the matched Mexican hat wavelet is more effective for defects of lower frequency. Based on the two types of band-pass filters, an automatic fabric defect detection system was designed which boasts good accuracy and high speed.
URI: http://hdl.handle.net/10397/60129
ISSN: 1560-6074
DOI: 10.1108/RJTA-08-02-2004-B003
Appears in Collections:Journal/Magazine Article

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