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Title: An automated testbed for profiling the packet send-time accuracy of embedded devices
Authors: Mok, KP
Li, W
Chang, R 
Yung, K
Chan, C
Issue Date: 2015
Publisher: ACM
Source: Proceedings of the 10th EAI International Conference on Testbeds and Research Infrastructures for the Development of Networks & Communities, Vancouver, Canada, 24-25 June 2015, p. 1 How to cite?
ISBN: 978-1-63190-070-9 (print)
Appears in Collections:Conference Paper

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