Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/59342
Title: Thermal annealing effect on electrical characteristics of CuPc thin-film transistors on glass with ZrO2 as gate dielectric
Authors: Tang, WM 
Helander, MG
Qiu, J
Greiner, MT
Lu, ZH
Ng, WT
Issue Date: 2015
Source: 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), Singapore, 1-4 June 2015, p. 1-4 How to cite?
URI: http://hdl.handle.net/10397/59342
Appears in Collections:Conference Paper

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