Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/59183
DC FieldValueLanguage
dc.contributorDepartment of Electronic and Information Engineering-
dc.creatorPechprasarn, S-
dc.creatorSomekh, MG-
dc.date.accessioned2016-11-04T03:34:43Z-
dc.date.available2016-11-04T03:34:43Z-
dc.identifier.urihttp://hdl.handle.net/10397/59183-
dc.language.isoenen_US
dc.titleSensitivity enhanced defocused confocal surface plasmons microscope using beam profile modulationen_US
dc.typeConference Paperen_US
dcterms.bibliographicCitation8th ASEAN Microscopy Conference (AMC8) and the 32nd Annual Conference and Meeting of the Microscopy Society of Thailand (MST32), Pathom, Thailand, Jan 2015 (CD)-
dcterms.issued2015-
dc.relation.conferenceASEAN Microscopy Conference [AMC]-
dc.relation.conferenceMicroscopy Society of Thailand. Conference and Meeting [MST Conference and Meeting]-
dc.identifier.rosgroupid2014002002-
dc.description.ros2014-2015 > Academic research: refereed > Refereed conference paper-
Appears in Collections:Conference Paper
Show simple item record

Page view(s)

83
Last Week
1
Last month
Citations as of Oct 21, 2020

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.