Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/5895
PIRA download icon_1.1View/Download Full Text
DC FieldValueLanguage
dc.contributorDepartment of Applied Physics-
dc.creatorPan, S-
dc.creatorYu, SF-
dc.creatorZhang, YX-
dc.creatorLuo, YY-
dc.creatorWang, S-
dc.creatorXu, JM-
dc.creatorLi, GH-
dc.date.accessioned2014-12-11T08:24:41Z-
dc.date.available2014-12-11T08:24:41Z-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10397/5895-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2013 AIP Publishing LLC. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Shu Sheng Pan et al., J. Appl. Phys. 113, 143104 (2013) and may be found at http://link.aip.org/link/?jap/113/143104en_US
dc.subjectCrystallitesen_US
dc.subjectEnergy gapen_US
dc.subjectExcitonsen_US
dc.subjectNanofabricationen_US
dc.subjectNanostructured materialsen_US
dc.subjectPhotoluminescenceen_US
dc.subjectSemiconductor growthen_US
dc.subjectSemiconductor thin filmsen_US
dc.subjectSputter depositionen_US
dc.subjectTin compoundsen_US
dc.titleCrystallite size-modulated exciton emission in SnO₂ nanocrystalline films grown by sputteringen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: Pan, Shu Sheng.en_US
dc.description.otherinformationAuthor name used in this publication: Yu, Siu Fung.en_US
dc.identifier.spage1-
dc.identifier.epage4-
dc.identifier.volume113-
dc.identifier.issue14-
dc.identifier.doi10.1063/1.4800896-
dcterms.abstractSnO ₂ nanocrystalline films with different crystallite sizes were grown by direct current sputtering. All the films show radiative recombination of free exciton (FX) and surface exciton (SX) with emission peaks varied from 330 to 338 nm and from 364 to 375 nm, respectively. The emission intensities of FX and SX versus crystallite size, excitation intensity, and temperature were also investigated. It was found that the emission intensities of both FX and SX increase with the decrease of the crystallite size of the films. In addition, the crystallite size has significant influence on the emission intensity of FX than SX. A model was also established to describe the relationship between crystallite size and excitonic emission intensity. From the temperature-dependent photoluminescence spectra, the activation energies of FX and SX are deduced.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationJournal of applied physics, 14 Apr. 2013, v. 113, no. 14, 143104, p. 1-4-
dcterms.isPartOfJournal of applied physics-
dcterms.issued2013-04-14-
dc.identifier.isiWOS:000318250600004-
dc.identifier.scopus2-s2.0-84876396522-
dc.identifier.eissn1089-7550-
dc.identifier.rosgroupidr67528-
dc.description.ros2012-2013 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
Appears in Collections:Journal/Magazine Article
Files in This Item:
File Description SizeFormat 
Pan_crystallite_size_modulated.pdf848.07 kBAdobe PDFView/Open
Open Access Information
Status open access
File Version Version of Record
Access
View full-text via PolyU eLinks SFX Query
Show simple item record

Page views

131
Last Week
1
Last month
Citations as of Apr 21, 2024

Downloads

254
Citations as of Apr 21, 2024

SCOPUSTM   
Citations

30
Last Week
0
Last month
4
Citations as of Apr 19, 2024

WEB OF SCIENCETM
Citations

26
Last Week
0
Last month
1
Citations as of Apr 25, 2024

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.